System and method to monitor and measure conductor in-circuit

A method comprising:

• calculating, at N frequencies, N values of a transfer function of a monitor and measurement circuit (MMC) formed by a voltage source and a voltage divider circuit connected to a conductor having a failure type,
• obtaining a sinusoidal function that fits the N values according to the failure type, the sinusoidal function having an argument, and
• calculating length of the conductor based on the argument,
• wherein the conductor is placed on a path through circuit elements.

An information handling system, comprising:

• a cooling unit to cool circuit elements;
• and
• a leak detector configured to detect leak from the cooling unit, comprising:
• a voltage divider circuit connected to a conductor to form a monitor and measurement circuit (MMC), the conductor being placed on a path through the circuit elements,
• a voltage source applied to voltage divider circuit to drive the MMC at N frequencies,
• a processor, and
• a memory containing instructions that, when executed by the processor, cause the processor to perform operations comprising:
• calculating N values of a transfer function of the MMC at the N frequencies,
• obtaining a sinusoidal function that fits the N values, the sinusoidal function having an argument, and
• calculating length of the conductor based on the argument.