US 2026/0030872 A1 · METHOD AND APPARATUS FOR EXTRACTING FEATURE INFORMATION

Abstract

An embodiment of the present application provides a method and apparatus for extracting feature information, which relates to the field of data processing technology. The method comprises: receiving a first operation input by a user to a terminal device, the first operation is used to trigger the terminal device to perform feature extraction on target material; in response to the first operation, sending configuration parameter request information to a server; receiving target configuration parameters sent by the server; and perform feature extraction on the target material based on the target configuration parameters to obtain feature information of the target material.

Claims20

Dependent claims

A method for extracting feature information, comprising:

receiving a first operation input by a user to a terminal device, wherein the first operation is used to trigger the terminal device to perform feature extraction on material;
in response to the first operation, transmitting a configuration parameter request to a server;
receiving a configuration parameter transmitted by the server;
and
performing the feature extraction on the material based on the configuration parameter to obtain the feature information of the material.

2 more elements

An electronic device, comprises:

a memory and a processor, wherein the memory is configured to store a computer program, the computer program, when executed by the processor, causes the electronic device to:
receive configuration parameter request information transmitted by a terminal device, wherein the configuration parameter request information is used to request a configuration parameter for performing feature extraction on material;
obtain configuration parameter corresponding to the configuration parameter request information;
and
transmit the configuration parameter to the terminal device, so that the terminal device performs the feature extraction on the material based on the configuration parameter.

2 more elements

Dependencies are inferred from the claim text.

Method and apparatus for extracting feature information

Life of this patent

Method and apparatus for extracting feature information

Life of this patent

Abstract

Claims20