Determining log templates of a computing device for log templatization

A computer program product comprising:

• one or more computer readable storage media, and program instructions collectively stored on the one or more computer readable storage media, the program instructions comprising:
• program instructions to obtain a set of log lines associated with operations performed at a computing device;
• program instructions to select a first sample of the set of log lines;
• program instructions to identify a first set of log templates from the first sample, the first set of log templates having a first quantity of log templates;
• program instructions to select a second sample of the set of log lines that is larger than the first sample;
• program instructions to identify a second set of log templates from the second sample, the second set of log templates having a second quantity of log templates;
• and
• program instructions to apply the first set of log templates to the set of log lines for log templatization based at least in part on the first quantity of log templates being equal to the second quantity of log templates.

A system comprising:

• one or more devices configured to:
• obtain a set of log lines associated with operations performed at a computing device;
• select a first sample of the set of log lines;
• identify a first set of log templates from the first sample, the first set of log templates having a first quantity of log templates;
• select a second sample of the set of log lines that is larger than the first sample;
• identify a second set of log templates from the second sample, the second set of log templates having a second quantity of log templates that is greater than the first quantity of log templates;
• select a third sample of the set of log lines that is larger than second sample;
• identify a third set of log templates from the third sample, the third set of log templates having a third quantity of log templates that is equal to the second quantity of log templates;
• and
• apply the second set of log templates to the set of log lines for log templatization based at least in part on the second quantity of log templates being equal to the third quantity of log templates.