Apparatuses and methods for probe tip alignment

An apparatus comprising:

• a plurality of probe pads comprising a plurality of sets of four probe pads;
• and
• a misalignment detector comprising:
• a first detection rail extending along a first side of a first set of the plurality of probe pads;
• a second detection rail extending along a second side of a second set of the plurality of probe pads, wherein the second side is opposite the first side;
• a third detection rail extending along the first side of a third set of the plurality of sets;
• a fourth detection rail extending along the second side of the third set of the plurality of sets;
• a fifth detection rail extending along the second side of a fourth set of the plurality of sets;
• and
• a sixth detection rail extending along the first side of a fifth set of the plurality of sets.

An apparatus comprising:

• a plurality of probe pads, wherein a first probe pad of the plurality of probe pads is at a first end and a last probe pad of the plurality of probe pads is at a second end opposite the first end;
• and
• a misalignment detector comprising:
• a first additional pad at the first end adjacent to the first pad;
• a second additional pad at the second end adjacent to the last pad;
• a first detection rail extending along a first side of the first additional pad and the plurality of probe pads stopping before the last probe pad;
• a second detection rail extending along a second side of the second additional pad and the plurality of probe pads stopping before the first probe pad, wherein the second side is opposite the first side;
• a plurality of left detection rails extending along third sides of the plurality of probe pads and the first and second additional pads;
• and
• a plurality of right detection rails extending along fourth sides of the plurality of probe pads and the first and second additional pads.