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US 2026/0029429 A1Published application
Test probe device
AssigneeFeinmetall GmbH
InventorsArno IHLE, Johannes KIRN
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AssigneeFeinmetall GmbH
InventorsArno IHLE, Johannes KIRN
Estimating the term…
The invention relates to a test probe device for making electrical contact with an in particular multi-pole contact partner, with a carrier part, which has at least one guide opening, and with at least one test probe, which is longitudinally displaceably mounted in the guide opening, wherein the test probe has a cylindrical housing in which one or more in particular pin-shaped contact elements are arranged, each of which have a contact end for making contact with the contact partner, wherein the housing has a guide portion longitudinally displaceably mounted in the guide opening and a contact portion spaced apart therefrom, and wherein the contact ends are assigned to the contact portion, wherein a spring element is pretensioned between the contact portion and the carrier part and, adjoining the guide portion at the housing, on the side of the carrier part facing away from the spring element, an axial stop is formed, which interacts with the carrier part against the spring force of the spring element, wherein a maximum rotational and/or tilting angle of the test probe is limited relative to the carrier part by the guide opening and the guide portion, for the purpose of which the guide opening and the guide portion in each case have a cross section with at least one straight line, in particular in each case a polygonal cross section, and wherein guide portion and guide opening are formed in such a way that the test probe can tumble in at least one sliding position relative to the carrier part. It is provided that a transfer portion is formed between the guide portion and the axial stop, that the transfer portion has a circular cross section, the diameter of which is at most as large as the smallest diagonal of the cross section of the guide opening on the one hand and smaller than the largest diagonal and larger than the smallest diagonal of the cross section of the guide portion on the other hand, so that the transfer portion, when viewed over its circumference, radially projects beyond the guide portion only in some regions.
A test probe device for making electrical contact with an multi-pole contact partner, with a carrier part, which has at least one guide opening, and with at least one test probe, which is longitudinally displaceably mounted in the guide opening, wherein the test probe has a cylindrical housing in which one or more pin-shaped contact elements are arranged, each of which have a contact end for making contact with the contact partner, wherein the housing has a guide portion longitudinally displaceably mounted in the guide opening and a contact portion spaced apart therefrom, and wherein the contact ends-are assigned to the contact portion, wherein a spring element is pretensioned between the contact portion and the carrier part and, adjoining the guide portion at the housing, on the side of the carrier part facing away from the spring element, an axial stop is formed, which interacts with the carrier part against the spring force of the spring element, wherein a maximum rotational and/or tilting angle of the test probe is limited about a longitudinal axis relative to the carrier part-by the guide opening and the guide portion, for the purpose of which the guide opening and the guide portion in each case have a polygonal cross section with at least one straight line, and wherein guide portion and guide opening are formed in such a way that the test probe-can tumble in at least one sliding position relative to the carrier part, wherein a transfer portion is formed between the guide portion and the axial stop, that the transfer portion has a circular cross section, the diameter of which is at most as large as the smallest inner width of the cross section of the guide opening on the one hand and smaller than the largest diagonal and larger than the smallest inner width of the cross section of the guide portion on the other hand, so that the transfer portion, when viewed over its circumference, radially projects beyond the guide portion only in some regions.
The test probe device according to, wherein the carrier part has several guide openings, in which a test probe is assembled or can be assembled in each case.
The test probe device according to, wherein the carrier part has a width, which is smaller than or equal to the width of the contact portion.
Dependencies are inferred from the claim text.