Wide area optical photothermal infrared spectroscopy
AssigneePhotothermal Spectroscopy Corp.
InventorsCraig Prater, Derek Decker, Roshan Shetty
Life of this patent
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Abstract
Apparatuses and methods for microscopic analysis of a sample by simultaneously characterizing infrared absorption characteristics of a plurality of spatially resolved locations are described herein. These apparatuses and methods improve sampling times while collecting microscopic data regarding composition of a sample across a wide field.
Claims21
1-31. (canceled)
An apparatus for microscopic analysis of a sample by simultaneously characterizing infrared absorption characteristics of a plurality of spatially resolved locations corresponding to a wide area of the sample, the apparatus comprising:
- an infrared light source configured to illuminate the wide area of the sample with a beam of infrared radiation;
- a probe light source configured to generate a beam of probe radiation, wherein the probe light source is configured to emit the beam of probe radiation in pulses having a duration less than 2 micro seconds;
- one or more optical elements arranged to direct the beam of infrared radiation and the beam of probe radiation to illuminate overlapping regions of the wide area of the sample;
- a collector configured to collect as collected probe radiation at least a portion of probe radiation from each of the plurality of spatially resolved locations on the sample;
- and
- at least one camera configured to detect at least a portion of the collected probe radiation to generate signals indicative of infrared absorption corresponding to each one of the plurality of spatially resolved locations.
A method of microscopic analysis of a sample by simultaneously characterizing infrared absorption characteristics of a plurality of spatially resolved locations corresponding to a wide area of the sample, the method comprising:
- illuminating the wide area of the sample with a beam of infrared radiation from an infrared light source;
- illuminating the wide area of the sample with a beam of probe radiation from a probe light source, wherein the probe light source emits the beam of probe radiation in pulses having a duration less than 2 microseconds;
- directing the beam of infrared radiation and the beam of probe radiation with one or more optical elements to overlap at the wide area of the sample;
- collecting probe radiation from each of the plurality of spatially resolved locations on the sample;
- and
- detecting the collected probe radiation with at least one camera to generate signals indicative of infrared absorption corresponding to each one of the plurality of spatially resolved locations.
Dependencies are inferred from the claim text.