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US 2026/0029302 A1Published application
Inspection apparatus and inspection method of light emitting element
OwnerSeok Jun Jininventor
Life of this patent
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Abstract
An inspection apparatus may include a collection part configured to acquire, according to a plurality of predetermined driving options, an image of first light emitting elements and second light emitting elements arranged in sub-pixels in a display panel, and a control part configured to calculate a number of defects for each driving option based on the acquired image, to compare the calculated number of defects for each driving option with a predetermined threshold value, and to determine whether the display panel is a usable normal panel based on a comparison result.
Claims11
An inspection apparatus comprising:
- a collection part configured to acquire, according to a plurality of predetermined driving options, an image of first light emitting elements and second light emitting elements arranged in sub-pixels in a display panel;
- and
- a control part configured to calculate a number of defects for each driving option based on the acquired image, to compare the calculated number of defects for each driving option with a predetermined threshold value, and to determine whether the display panel is a usable normal panel based on a comparison result.
An inspection method comprising:
- calculating a number of defects for each driving option by driving, according to a plurality of predetermined driving options, first light emitting elements and second light emitting elements arranged in sub-pixels in a display panel;
- and
- determining whether the display panel is a usable normal panel by comparing a calculated number of defects for each driving option with a predetermined threshold value.
Dependencies are inferred from the claim text.