Circuit Optimization Method and System for Digital Domain Correction of Temperature Sensor

Abstract

A circuit optimization method and system for a digital domain correction of a temperature sensor is provided. The method includes: subjecting negative temperature coefficient voltages Vbep and Vben to a switch timing control, thereby generating a corresponding negative temperature coefficient voltage Vbep and positive temperature coefficient voltage Dvbe as inputs into an operational transconductance amplifier (OTA) that serves as a core circuit of a Sigam-Delt analog-to-digital converter (ADC); and generating, by a switch sampling circuit, Vintx by integrating; inputting the Vintx into a comparator (CMP) to acquire a final ADC output; and sending a feedback through a digital domain to an analog domain control switch logic. The circuit optimization method intelligently finds the optimal temperature factor of different processes through the digital domain correction, thereby acquiring the desired ratio value more accurately. Meanwhile, the circuit optimization method reduces the trim circuit to be implemented in the analog domain.

Dependencies are inferred from the claim text.