Methods and systems for contactless object measurement
AssigneeShanghai Gnd Etech Co., Ltd.
InventorsZihuan Xia, Chao Lian, Jie Xu, Gaosheng Shi, Duo Wu, Jie Ji, Qiujin Wang
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AssigneeShanghai Gnd Etech Co., Ltd.
InventorsZihuan Xia, Chao Lian, Jie Xu, Gaosheng Shi, Duo Wu, Jie Ji, Qiujin Wang
Estimating the term…
Provided are system and method for contactless precision measurement of the position of the system relative to a nearby object. The system comprises a workpiece, at least one low-profile assembly, and a central control unit. The low-profile assembly comprises a main axis directed to a first direction and approximately parallel to the surface of the workpiece to intersect the inner surface of the object. The assembly further comprises at least one projector for projecting an electromagnetic beam onto the object for the measurement. Both the low-profile assembly and the central control unit are attached on the surface of the workpiece at desired locations. The system can be operated stand alone in an enclosed and dimensional constrained operation environment.
A system comprising:
A method for contactless measurement of an object, the method comprising:
A system comprising:
A method for contactless measurement of an object, the method comprising:
Dependencies are inferred from the claim text.