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US 2026/0016533 A1Published application
Test interconnect with integrated loopbacks
AssigneeEssai, Inc.
InventorsJames HASTINGS, Nader Nasser ABAZARNIA, Quaid Joher FURNITUREWALA, Rolf NEUWEILER, Juergen SERRER, Joe XIAO
Life of this patent
Estimating the term…
Abstract
Test interconnect systems and methods are described. In one example, a test interconnect includes. A device under test (DUT) interface for connecting to a DUT; a load board interface for connecting to a load board; a circuitized component including an integrated loopback for self-test or self-communication of the DUT; and one or more conductive paths for connecting the DUT to the load board.
Claims30
A test interconnect comprising:
- a device under test (DUT) interface for connecting to a DUT;
- a load board interface for connecting to a load board;
- a circuitized component comprising one or more integrated loopbacks for self-test or self-communication of the DUT;
- and
- one or more conductive paths for connecting the DUT to the load board.
2 more elements
A system comprising:
- a load board;
- and
- a test interconnect comprising:
- a device under test (DUT) interface for connecting to a DUT;
- a load board interface for connecting to the load board;
- a circuitized component comprising one or more integrated loopbacks for self-test or self-communication of the DUT;
- and
- one or more conductive paths for connecting the DUT to the load board.
5 more elements
A method for loopback testing of a DUT, the method comprising:
- configuring a test interconnect to include a device under test (DUT) interface for connecting to a DUT, a load board interface for connecting to a load board, and one or more integrated loopbacks for self-test or self-communication of the DUT;
- applying, using the test interconnect and the load board, a supply voltage and a test pattern that causes the DUT to perform a loopback functionality or a self-test functionality;
- and
- performing a management action based on a result of the loopback functionality or the self-test functionality.
1 more element
A test interconnect comprising:
- a device under test (DUT) interface for connecting to a DUT;
- a load board interface for connecting to a load board;
- a circuitized component comprising one or more integrated loopbacks for self-test or self-communication of the DUT;
- and
- a Kelvin-type measurement probe that connects to a supply voltage measurement contact.
2 more elements
Dependencies are inferred from the claim text.