Plasma processing system and method for estimating height of annular member
AssigneeTokyo Electron Limited
InventorsTakashi ARAMAKI, Ryota KOITABASHI, Lifu LI, Hiroshi TSUJIMOTO
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AssigneeTokyo Electron Limited
InventorsTakashi ARAMAKI, Ryota KOITABASHI, Lifu LI, Hiroshi TSUJIMOTO
Estimating the term…
A plasma processing system includes control circuitry that executes (A) loading a jig substrate having a reference surface serving as a reference of the height of an annular member into the processing container and placing a jig substrate on a substrate support, (B) applying a voltage to a electrostatic chuck in a state where the gas is supplied into a processing container and attracting the jig substrate to a substrate placing surface in a plasma-less manner, (C) positioning a holder of a transfer robot above the substrate support and measuring, by a distance sensor, a distance to the reference surface of the jig substrate placed on the substrate placing surface and a distance to the annular member attached to the substrate support, and (D) estimating the height of the annular member based on measurement results of the distance to the reference surface and the distance to the annular member.
A plasma processing system comprising:
A method for estimating a height of an annular member in a plasma processing system which includes a plasma processing apparatus, and a reduced-pressure transfer apparatus connected to the plasma processing apparatus and including a transfer robot configured to transfer a substrate, the plasma processing apparatus including a processing container configured to be depressurized, a substrate support which is provided in the processing container and includes a substrate placing surface and an electrostatic chuck configured to electrostatically attract the substrate to the substrate placing surface, and to which the annular member is attached so as to surround the substrate placing surface, and an elevation mechanism configured to raise and lower the substrate relative to the substrate placing surface, the transfer robot including a holder configured to hold the substrate to be transferred, and a distance sensor provided on the holder and configured to measure a distance from the holder, the method comprising:
Dependencies are inferred from the claim text.