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AssigneeFulian Precision Electronics (Tianjin) Co., LTD.
InventorsCHI-WEN CHEN, Wei-Ming LEE
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The present application discloses an electrical testing device, an electrical testing method and a storage medium. The electrical testing device includes a power supply, a capacitive load device used to provide a capacitive load for the power supply, and a testing device. The testing device is used to test electrical information of the power supply according to the capacitive load. The capacitive load device comprises a capacitor, a switch and a microcontroller. The capacitor is connected to the testing device and used to provide the capacitive load for the power supply by the testing device. The switch is connected to the capacitor and used to control connection and disconnection between the capacitor and the power supply. The microcontroller is connected to the switch and is used to control the connection and disconnection of the switch according to a level signal received by the microcontroller.
An electrical testing device comprising:
An electrical testing method, applied in an electrical testing device, the electrical testing method comprising:
A non-transitory storage medium having stored thereon instructions that, when executed by at least one processor of an electrical testing device, causes the least one processor to execute instructions of an electrical testing method, the method comprising:
Dependencies are inferred from the claim text.