Analysis method

An analysis method comprising:

• creating a regression equation based on a value of a signal intensity obtained by performing any one of the following operation 1, 2, 3, or 4 and an amount of an analysis object that is removed by laser light irradiation in a standard sample film;
• and
• using the regression equation to calculate an amount of the analysis object that is removed by laser light irradiation in a solid analysis sample including the analysis object,
• the operation 1:
• an operation X of disposing the standard sample film including the analysis object on the solid analysis sample including the analysis object to obtain a laminate for analysis, irradiating the laminate for analysis with laser light, and detecting a signal intensity derived from the analysis object in the standard sample film and derived from the analysis object in the analysis sample is performed two or more times while changing a concentration of the analysis object in the standard sample film;
• the operation 2:
• the operation X is performed at least once and at least an operation Y of irradiating the analysis sample with laser light and detecting a signal intensity derived from the analysis object in the analysis sample is performed;
• the operation 3:
• the operation X is performed at least once and at least an operation Z of disposing a reference sample film not including the analysis object on the analysis sample to obtain a laminate for reference, irradiating the laminate for reference with laser light, and detecting a signal intensity derived from the analysis object in the analysis sample is performed;
• and
• the operation 4:
• the operation X is performed two or more times while changing the number of the standard sample films laminated or a thickness of the standard sample film.