Electronic circuit

A temperature profiling circuit configured to operate within a temperature range, comprising:

• a voltage supply terminal configured to provide a supply voltage;
• a data collection circuit comprising:
• a reference transistor, comprising a gate terminal and a channel between a source terminal and a drain terminal, wherein the channel is connected between the voltage supply terminal and a measurement node;
• a plurality of data collection transistors, each comprising a gate terminal and a channel between a source terminal and a drain terminal, wherein the channel of each reference transistor is connected between the voltage supply terminal and a measurement node, wherein:
• each data collection transistor of the plurality of data collection transistors is associated with a different temperature sub-range of the temperature range;
• and
• a control circuit, configured to, during a data collection mode of the temperature profiling circuit:
• receive a temperature signal which is indicative of a present temperature;
• identify an active data collection transistor as the data collection transistor that is associated with the temperature sub-range that includes the present temperature;
• provide a reference voltage to the gate terminal of the active data collection transistor, such that a potential difference between the gate terminal and the source terminal of the active data collection transistor is greater than a predetermined voltage;
• provide the supply voltage to the gate terminals of all data collection transistors apart from the active data collection transistor such that a potential difference between the gate terminal and the source terminal of each of the other data collection transistors is not greater than the predetermined voltage;
• and
• provide the supply voltage to the gate terminal of the reference transistor such that a potential difference between the gate terminal and the source terminal of the reference transistor is not greater than the predetermined voltage;
• such that a temperature profile, which is indicative of the amount of time the temperature profiling circuit has spent within each temperature sub-range, is determinable in a temperature profile determining mode by comparing one or more characteristics of each of the plurality of the data collection transistors to those of the reference transistor.