Spin on carbon hardmask compositions with low evaporation loss and patterning method by using the same
AssigneeYcchem Co., Ltd.
InventorsSu Jin LEE, Gi Hong KIM, Seung Hun LEE, Seung Hyun LEE
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AssigneeYcchem Co., Ltd.
InventorsSu Jin LEE, Gi Hong KIM, Seung Hun LEE, Seung Hyun LEE
Estimating the term…
The objective is to provide a spin-on hardmask composition exhibiting a small evaporation loss and being suitable for use in a semiconductor photolithography process which means to provide a composition containing a polymer represented by Formula 1, a surfactant, and an organic solvent and a patterning method using the same composition. The hardmask produced by the method has the effect of a yield improvement with excellent heat resistance by minimizing evaporation loss which is a cause of defects in a process.
A spin-on carbon hardmask composition comprising a polymer having a structure represented by Formula 1 shown below and having a weight average molecular weight in a range of 1,500 to 20,000, the composition exhibiting a small evaporation loss when baked at a temperature of 400° C.
Dependencies are inferred from the claim text.