Measurement system, processing system, measurement method, and processing method
AssigneeNikon Corporation
InventorsTakashi NAKAMURA, Tomoki MIYAKAWA
Life of this patent
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AssigneeNikon Corporation
InventorsTakashi NAKAMURA, Tomoki MIYAKAWA
Estimating the term…
A measurement system includes: a first measurement apparatus that is configured to measure a position of a measurement member attached to a movable part of a processing apparatus; and a measurement control apparatus that is configured to control the first measurement apparatus. The measurement control apparatus includes: an arithmetic unit that calculates position transformation information, based on first position information indicating the position of the measurement member measured by the first measurement apparatus in a first state, and based on second position information indicating the predetermined position; and a transmission unit that transmits the calculated position transformation information to a processing control apparatus configured to control a movement of the movable part of the processing apparatus. The transmission unit transmits, to the processing control apparatus, third position information indicating the position of the measurement member measured by the first measurement apparatus in a second state.
-123. (canceled)
A measurement system comprising:
A measurement method in a measurement system including:
Dependencies are inferred from the claim text.