Cmos rgb-ir sensor with quadruple-well stack structure
AssigneeHimax Imaging Limited
InventorsYoungchul Sohn, Kihong Kim
Life of this patent
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AssigneeHimax Imaging Limited
InventorsYoungchul Sohn, Kihong Kim
Estimating the term…
An active pixel sensor control circuit for a CMOS image sensor includes: a first control circuit including a transfer transistor, a reset transistor, a source follower and a select transistor, wherein the reset transistor and the source follower are coupled to a first power supply signal; and a second type control circuit including a transfer transistor, a reset transistor, a source follower and a select transistor, wherein the source follower is coupled to the first power supply signal and the reset transistor is coupled to a second power supply signal. When a transfer signal is applied to the gates of the transfer transistors and a reset signal is applied to the gates of the reset transistors, a second photodiode and a fourth photodiode are charged to the first power supply level, and a first photodiode and a third photodiode are discharged to the second power supply level.
An active pixel sensor control circuit for converting incident light received by a CMOS image sensor into electrical charge, the CMOS image sensor having a potential well stack structure comprising a first p-well, a first n-well disposed below the first p-well, a second p-well disposed below the first n-well, a second n-well disposed below the second p-well, and a third p-well disposed below the second n-well, wherein a first photodiode is formed at the junction between the first p-well and the first n-well, a second photodiode is formed at the junction between the first n-well and the second p-well, a third photodiode is formed at the junction between the second p-well and the second n-well, and a fourth photodiode is formed at the junction between the second n-well and the third p-well, the active pixel sensor control circuit comprising:
Dependencies are inferred from the claim text.