Production control method for a projection exposure apparatus, projection exposure apparatus, and projection exposure method
AssigneeCarl Zeiss SMT GmbH
InventorMartin LEUERMANN
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AssigneeCarl Zeiss SMT GmbH
InventorMartin LEUERMANN
Estimating the term…
A production control method controls the operation of a microlithographic projection exposure apparatus comprising a projection lens; a wavefront manipulation system comprising a manipulator and an optical encoder, the wavefront manipulation system configured to controllably influence the wavefront of the projection radiation, and a controller configured to control the manipulator of the manipulation system by generating an actuator travel command which defines a change in the spatial pose along an actuator travel of the optical element. The controller in at least one error-optimized mode of operation selectively establishes actuator travels of the manipulator with consideration being given to cyclical errors of the phase-based optical encoder of the wavefront manipulation system, in such a way that a second cyclical error at the end of an actuator travel substantially corresponds to a first cyclical error at the start of an actuator travel.
A method comprising:
A apparatus comprising:
A method comprising:
Dependencies are inferred from the claim text.