Systems and methods of estimating thermal properties of semiconductor devices

An automation system, comprising:

• at least one processor;
• and
• at least one memory including computer program code for one or more programs, the at least one memory and the computer program code configured to, with the at least one processor, cause the system to:
• identify at least a first net and at least a second net of a formed integrated circuit, wherein the first net and the second net extend through the integrated circuit with respectively different heat propagation paths;
• constitute the first net with a plurality of first grid units;
• constitute the second net with a plurality of second grid units;
• estimate a first thermal conductivity of each of the first grid units;
• estimate a second thermal conductivities of each of the second grid units;
• and
• estimate an equivalent thermal conductivity of the integrated circuit based on the estimated first thermal conductivity and the second thermal conductivity.

A non-transitory computer readable medium comprising computer executable instructions for carrying out a method for analyzing an integrated circuit, the method comprising:

• identifying at least a first net and at least a second net of a formed integrated circuit, wherein the first net and the second net extend through the integrated circuit with respectively different heat propagation paths;
• constituting the first net with a plurality of first grid units;
• constituting the second net with a plurality of second grid units;
• estimating a first thermal conductivity of each of the first grid units;
• estimating a second thermal conductivities of each of the second grid units;
• and
• estimating an equivalent thermal conductivity of the integrated circuit based on the estimated first thermal conductivity and the second thermal conductivity.