Constructing a substrate topology map based on measured properties

A method, comprising:

• receiving, from a first displacement sensor, sensor data indicative of one or more properties of a top surface of a substrate, wherein the one or more properties are associated with at least one of substrate bow or substrate warpage;
• constructing a substrate topology map based on the received sensor data, wherein the substrate topology map is indicative of at least one of the substrate bow or the substrate warpage;
• and
• causing management of the substrate based on the substrate topology.

A non-transitory machine-readable storage medium comprising instructions that, when executed by a processing device, cause the processing device to perform operations comprising:

• receiving, from a first displacement sensor, sensor data indicative of one or more properties of a top surface of a substrate, wherein the one or more properties are associated with at least one of substrate bow or substrate warpage;
• constructing a substrate topology map based on the received sensor data, wherein the substrate topology map is indicative of at least one of the substrate bow or the substrate warpage;
• and
• causing management of the substrate based on the substrate topology.