Circuit and method for measuring and correcting interleaving spur of at least one time-interleaved digital-to-analog converter in delta-sigma analog-to-digital converter

A correction system for correcting an interleaving (IL) spur of at least one time-interleaved digital-to-analog converter (DAC) included in a delta-sigma (DS) analog-to-digital converter (ADC), comprising:

• a measuring circuit, comprising:
• a dither tone generator circuit, configured to generate a dither tone with a pre-defined tone frequency, and inject the dither tone to the DS ADC;
• and
• a digital signal processing circuit, configured to process a digital output of the DS ADC with the dither tone injected, to generate a measurement result of the IL spur that is induced by the at least one time-interleaved DAC due to the injected dither tone;
• and
• a control circuit, configured to adjust IL spur correction of the at least one time-interleaved DAC according to the measurement result.