Ohmic contact formation in a sic-based electronic device
AssigneeSTMicroelectronics International N.V.
InventorsSimone RASCUNÁ, Mario Giuseppe SAGGIO, Giovanni FRANCO
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AssigneeSTMicroelectronics International N.V.
InventorsSimone RASCUNÁ, Mario Giuseppe SAGGIO, Giovanni FRANCO
Estimating the term…
A method for manufacturing a SiC-based electronic device, comprising the steps of: implanting, on a front side of a solid body made of SiC having a conductivity of an N type, dopant species of a P type thus forming an implanted region, which extends in the solid body starting from the front side and has a top surface coplanar with the front side; and generating a laser beam directed towards the implanted region in order to generate heating of the implanted region to temperatures comprised between 1500° C. and 2600° C. so as to form a carbon-rich electrical-contact region at the implanted region. The carbon-rich electrical-contact region forms an ohmic contact.
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Dependencies are inferred from the claim text.