Carrier substrate and manufacturing method of semiconductor package using same
AssigneeSamsung Electronics Co., Ltd.
InventorsHosin SONG, Yeongkwon KO, Jiyoung PARK, Junyeong HEO
Life of this patent
Estimating the term…
Abstract
A carrier substrate according to some example embodiments is a carrier substrate having a circular disk shape, and includes a first surface, a second surface opposite surface to first surface, and an inclined surface that extends along the edge of the first surface, has an inclination angle from the first surface, and is configured to reflect incident light from the second surface.
Claims20
A carrier substrate having a circular disk shape, comprising:
- a first surface;
- a second surface opposite to the first surface;
- and
- an inclined surface that
- extends along an edge of the first surface,
- has an inclination angle from the first surface, and
- is configured to reflect incident light radiated from the second surface.
A carrier substrate which has a circular disk shape and is transparent, comprising:
- a first surface;
- a second surface opposite to the first surface;
- an inclined surface that extends along an edge of the first surface, has an inclination angle from the first surface, and is inclined toward the second surface;
- and
- a side surface that extends from an edge of the inclined surface to an edge of the second surface,
- wherein the inclination angle satisfies the following expression:
- arcsin
-
- (
- n
- a
- /
- n
- s
- )
- ≤
- a
- <
- 90
-
- °
- ,
- [
- Expression
- ]
- and
- in the expression, a, na, and ns are the inclination angle in degrees, the refractive index of air, and the refractive index of the carrier substrate, respectively.
A method of manufacturing a semiconductor package, comprising:
- preparing a carrier substrate, the carrier substrate having a circular disk shape, including an inclined surface extending along an edge, and defining a notch groove having the shape of a cut at the edge;
- bonding a wafer structure onto the carrier substrate;
- aligning the carrier substrate;
- processing the wafer structure;
- and
- debonding the carrier substrate,
- wherein in the aligning of the carrier substrate,
- a position of the notch groove is detected by radiating light onto the inclined surface such that light incident on the inclined surface is reflected thereby.
Dependencies are inferred from the claim text.