Dry-developing resist film formed of metal-containing resist
AssigneeTokyo Electron Limited
InventorsYuta NAKANE, Kenta ONO, Sho KUMAKURA, Tetsuya NISHIZUKA, Masanobu HONDA
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AssigneeTokyo Electron Limited
InventorsYuta NAKANE, Kenta ONO, Sho KUMAKURA, Tetsuya NISHIZUKA, Masanobu HONDA
Estimating the term…
A method for processing a substrate is disclosed. The method includes (a) providing a substrate on a substrate support in a processing chamber, the substrate having an underlying film and a resist film disposed on the underlying film and formed of a metal-containing resist, and the resist film having a first region and a second region. The method further includes (b) dry-developing the resist film by supplying a processing gas containing a carboxylic acid into the processing chamber, exposing the substrate to the carboxylic acid, and selectively removing the second region with respect to the first region. In the (b), a pressure or a partial pressure of the carboxylic acid is 0.3 Torr (40 Pa) or more and less than 100 Torr (13,332 Pa).
A method for processing a substrate comprising:
A system for processing a substrate comprising:
Dependencies are inferred from the claim text.