Apparatus and methods for managing wear leveling in memory
AssigneeMicron Technology, Inc.
InventorMohammed A. Khan
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AssigneeMicron Technology, Inc.
InventorMohammed A. Khan
Estimating the term…
Systems might include tester hardware for connection to a die containing a memory comprising a plurality of groupings of memory cells and a predictive model in communication with the tester hardware, wherein a controller of the tester hardware is configured to generate characterization data corresponding to a first grouping of memory cells, wherein the predictive model is configured to generate an indication of expected endurance for the first grouping of memory cells in response to the characterization data in response to process data corresponding to the first grouping of memory cells, and wherein the controller is further configured to store a value to the memory indicative of the indication of expected endurance. Methods could use the predictive model in wear leveling within a memory, and memories could use information regarding expected endurance in wear leveling.
A system, comprising:
A method, comprising:
A memory, comprising:
Dependencies are inferred from the claim text.