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US 2025/0166718 A1Published application
Detecting extrinsic bitline defects
AssigneeMicron Technology, Inc.
InventorsTingjun Hu, Wai Leong Chin, Chia Yu Kuo
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AssigneeMicron Technology, Inc.
InventorsTingjun Hu, Wai Leong Chin, Chia Yu Kuo
Estimating the term…
Aspects of the present disclosure configure a memory sub-system controller to detect extrinsic bitline defects. The controller stores a set of data in a set of memory components and performs a set of memory operations for detecting an empty page in a portion of the set of memory components. The controller determines, based on performing the set of memory operations, that the portion of the set of memory components is associated with an extrinsic bitline defect. The controller, in response to determining that the portion of the set of memory components is associated with the extrinsic bitline defect, prevents write operations to the portion of the set of memory components.
A system comprising:
A method comprising:
A non-transitory computer-readable storage medium comprising instructions that, when executed by at least one processing device, cause the at least one processing device to perform operations comprising:
Dependencies are inferred from the claim text.