Time tag word line shift to reduce failed bit count spikes for edge word lines
AssigneeWestern Digital Technologies, Inc.
InventorsGanapati Bhat, Binoy Jose Panakkal, Gopu S, Bhavadip Bipinbhai Solanki
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AssigneeWestern Digital Technologies, Inc.
InventorsGanapati Bhat, Binoy Jose Panakkal, Gopu S, Bhavadip Bipinbhai Solanki
Estimating the term…
When an open block of NAND memory is read, this places the edge word lines under a set of bias conditions that can lead to disturbs. When time tag values are stored on predefined word lines, and the predefined word line is an edge word line, this can degrade not just the user data on the word line, but also the time tag values, leading to a failed bit count spike. To address this problem, a time tag word line shift approach is introduced where, if a predetermined time tag acquisition word line is an edge word line, another word line is instead used to acquire the time tag value.
A non-volatile memory system, comprising:
A method, comprising:
A non-volatile memory system, comprising:
Dependencies are inferred from the claim text.