Electronic device for optimizing semiconductor characteristics based on plackett-burman design and genetic algorithm, and operating method thereof

An operating method of an electronic device, the operating method comprising:

• generating an initial design of experiment (DOE) set comprising a plurality of initial cases regarding semiconductor characteristics of a memory device of an external device;
• transmitting, to the external device, the initial DOE set;
• receiving, from the external device, an initial characteristic evaluation performed based on the initial DOE set;
• generating a starting DOE set based on the initial characteristic evaluation;
• and
• generating an output DOE set by performing a genetic algorithm with an experimental result of the starting DOE set as an input,
• wherein each of the plurality of initial cases corresponds to a combination of a plurality of setting values influencing the semiconductor characteristics.

A system, comprising:

• a first electronic device configured to:
• generate an initial design of experiment (DOE) set comprising a plurality of initial cases regarding semiconductor characteristics of a memory device of a second electronic device;
• transmit, to the second electronic device, the initial DOE set;
• receive, from the second electronic device, an initial characteristic evaluation corresponding to the initial DOE set;
• generate a starting DOE set based on the initial characteristic evaluation;
• and
• perform a genetic algorithm with an experimental result of the starting DOE set as an input;
• and
• the second electronic device configured to:
• receive, from the first electronic device, the initial DOE set comprising the plurality of initial cases;
• perform semiconductor characteristic evaluation by setting the memory device based on respective setting values of the plurality of initial cases, and
• transmit, to the first electronic device, the initial characteristic evaluation corresponding to a result of the performed semiconductor characteristic evaluation,
• wherein each of the plurality of initial cases corresponds to a combination of a plurality of setting values influencing the semiconductor characteristics, and
• wherein the first electronic device is further configured to:
• perform linear analysis for each of the plurality of setting values based on the initial characteristic evaluation;
• determine the plurality of setting values based on a result of the linear analysis;
• generate an optimal case comprising the plurality of determined setting values;
• and
• generate the starting DOE set by merging the plurality of initial cases, the optimal case, and a base case in which the plurality of setting values are set to off.