Processor testing method, electronic device, and storage medium
AssigneeBeijing Horizon Information Technology Co., Ltd.
InventorJinnan DING
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AssigneeBeijing Horizon Information Technology Co., Ltd.
InventorJinnan DING
Estimating the term…
Embodiments of this disclosure disclose a processor testing method, an electronic device, and a storage medium. The method includes: obtaining an initialization instruction; initializing a preset parameter in a storage space to a test input value based on the initialization instruction; controlling an operation unit to perform operation on the test input value, to obtain an operation result; and determining a test result based on the operation result. In the embodiments of this disclosure, the preset parameter in the storage space is initialized as the test input value based on the initialization instruction, so that a same type of operation units in all processor cores of a processor can concurrently perform same operation on the test input value to obtain the operation result. Frequent loading and caching of the standard result can be avoided during a testing process, thereby efficiently improving testing efficiency.
A processor testing method, comprising:
A non-transient computer readable storage medium, wherein the storage medium stores a computer program, and the computer program is used for implementing a processor testing method while being executed by a processor, wherein the processor testing method comprises:
An electronic device, wherein the electronic device comprises:
Dependencies are inferred from the claim text.