Devices, Systems, and Methods for Digital Microscopy
AssigneeIDEXX Laboratories, Inc.
InventorJeremy Hammond
Life of this patent
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AssigneeIDEXX Laboratories, Inc.
InventorJeremy Hammond
Estimating the term…
A method for interrogating a sample with a microscopy analyzer is disclosed. The method includes capturing, by an imaging sensor, of the microscopy analyzer, one or more first images, determining a stain intensity, modifying an intensity of a light source of the microscopy analyzer, based at least in part on the determined stain intensity, in response to modifying the intensity of the light source, capturing one or more second images from the imaging sensor, inputting the one or more first images and the one or more second images into one or more machine learning models, identifying, via the one or more machine learning models, one or more characteristics of the one or more first images and the one or more second images, and transmitting instructions that cause a graphical user interface to display a graphical indication of the one or more characteristics.
A method for interrogating a sample with a microscopy analyzer, the method comprising:
A non-transitory, computer-readable medium having instructions stored thereon, wherein the instructions, when executed by one or more processors, cause the one or more processors to perform a set of operations comprising:
A microscopy analyzer comprising:
Dependencies are inferred from the claim text.