Method and device for simplified determination of effective electron lifetime
AssigneesCentre National De La Recherche Scientifique, Institut Photovoltaique d'Ile-de-France, Electricite de France, Totalenergies Onetech, Ecole Polytechnique
InventorMateusz POPLAWSKI
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Abstract
A method and device for determining effective electron lifetime in a component to be analysed, including emitting an excitation light beam with pulses, detecting a photoluminescence light emitted by the component in response to the excitation light beam, and for each of said pulses of the excitation light beam, calculating an effective electron lifetime value based on a temporal shift between this pulse and a corresponding pulse of the photoluminescence light.
Claims12
A method for determining effective electron lifetime in a component (2) to be analysed, comprising:
- emitting an excitation light beam (10) comprising one or several pulses (50),
- detecting a photoluminescence light (58) emitted by the component (2) in response to the excitation light beam (10),
- for each or at least one of said pulses (50) of the excitation light beam (10), calculating an effective electron lifetime value based on a temporal shift between this pulse (50) and a corresponding pulse (60) of the photoluminescence light (58).
Dependencies are inferred from the claim text.