Nitride structure and semiconductor device
AssigneesKabushiki Kaisha Toshiba, Toshiba Electronic Devices & Storage Corporation
InventorsHajime NAGO, Hisashi YOSHIDA, Jumpei TAJIMA, Toshiki HIKOSAKA
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AssigneesKabushiki Kaisha Toshiba, Toshiba Electronic Devices & Storage Corporation
InventorsHajime NAGO, Hisashi YOSHIDA, Jumpei TAJIMA, Toshiki HIKOSAKA
Estimating the term…
According to one embodiment, a nitride structure includes a stacked body. The stacked body includes a base including silicon, a first nitride region including AlN, and a second nitride region including Alz2Ga1-z2N (0≤z2<1). The first nitride region is provided between the base and the second nitride region in a first direction. The stacked body includes a first interface region including a first interface between the base and the first nitride region. The first interface region includes a first peak position in the first direction. A chlorine concentration profile along the first direction in the stacked body has a chlorine peak value at the first peak position.
A nitride structure, comprising:
Dependencies are inferred from the claim text.