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US 2025/0159940 A1Published application
Semiconductor device and manufacturing method thereof
AssigneeSemiconductor Energy Laboratory Co., Ltd.
InventorShunpei YAMAZAKI
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Abstract
A semiconductor device includes an oxide semiconductor layer including a crystalline region over an insulating surface, a source electrode layer and a drain electrode layer in contact with the oxide semiconductor layer, a gate insulating layer covering the oxide semiconductor layer, the source electrode layer, and the drain electrode layer, and a gate electrode layer over the gate insulating layer in a region overlapping with the crystalline region. The crystalline region includes a crystal whose c-axis is aligned in a direction substantially perpendicular to a surface of the oxide semiconductor layer.
Claims3
(canceled)
A semiconductor device comprising:
- a first transistor including silicon in its channel formation region;
- a first insulating layer over a gate electrode of the first transistor;
- a first conductive layer electrically connected to the channel formation region of the first transistor through a first opening provided in the first insulating layer, and configured to be one of a source electrode and a drain electrode of the first transistor;
- a second conductive layer in contact with a top surface of the first insulating layer, and electrically connected to the first conductive layer;
- a second insulating layer having a region in contact with a top surface of the second conductive layer;
- a second transistor including oxide semiconductor in its channel formation region, over the second insulating layer;
- a third insulating layer having a region in contact with a top surface of the oxide semiconductor;
- a third conductive layer over the third insulating layer, and configured to be a gate electrode of the second transistor;
- a fourth insulating layer over the third conductive layer;
- a fourth conductive layer electrically connected to the first conductive layer and the second conductive layer through a second opening provided in the fourth insulating layer;
- a fifth conductive layer in contact with a top surface of the fourth conductive layer;
- a fifth insulating layer having a region in contact with a side surface of the fifth conductive layer;
- a sixth conductive layer electrically connected to one of a source and a drain of the second transistor, and electrically connected to the first transistor through a third opening provided in the first insulating layer;
- a seventh conductive layer overlapping the sixth conductive layer;
- an eighth conductive layer over the seventh conductive layer, and overlapping the sixth conductive layer;
- and
- a ninth conductive layer in contact with a top surface of the eighth conductive layer,
- wherein the second insulating layer has a region in contact with a top surface of the seventh conductive layer, and
- wherein the fifth insulating layer has a region in contact with a side surface of the ninth conductive layer.
16 more elements
A semiconductor device comprising:
- a first transistor including silicon in its channel formation region;
- a first insulating layer over a gate electrode of the first transistor;
- a first conductive layer electrically connected to the channel formation region of the first transistor through a first opening provided in the first insulating layer, and configured to be one of a source electrode and a drain electrode of the first transistor;
- a second conductive layer in contact with a top surface of the first insulating layer, and electrically connected to the first conductive layer;
- a second insulating layer having a region in contact with a top surface of the second conductive layer;
- a second transistor including oxide semiconductor in its channel formation region, over the second insulating layer;
- a third insulating layer having a region in contact with a top surface of the oxide semiconductor;
- a third conductive layer over the third insulating layer, and configured to be a gate electrode of the second transistor;
- a fourth insulating layer over the third conductive layer;
- a fourth conductive layer electrically connected to the first conductive layer and the second conductive layer through a second opening provided in the fourth insulating layer;
- a fifth conductive layer in contact with a top surface of the fourth conductive layer;
- a fifth insulating layer having a region in contact with a side surface of the fifth conductive layer;
- a sixth conductive layer electrically connected to one of a source and a drain of the second transistor, and electrically connected to the first transistor through a third opening provided in the first insulating layer;
- a seventh conductive layer overlapping the sixth conductive layer;
- an eighth conductive layer over the seventh conductive layer, and overlapping the sixth conductive layer;
- and
- a ninth conductive layer in contact with a top surface of the eighth conductive layer,
- wherein the second insulating layer has a region in contact with a top surface of the seventh conductive layer,
- wherein the fifth insulating layer has a region in contact with a side surface of the ninth conductive layer, and
- wherein, in a cross sectional view of a channel length direction of the second transistor, a width of the third conductive layer is smaller than a width of the oxide semiconductor.
17 more elements
Dependencies are inferred from the claim text.