Circuit layout verification method and system
AssigneeRaydium Semiconductor Corporation
InventorsChi-Huang CHANG, Cheng-Ta LIN
Life of this patent
Estimating the term…
Loading patent…
AssigneeRaydium Semiconductor Corporation
InventorsChi-Huang CHANG, Cheng-Ta LIN
Estimating the term…
A method for circuit layout verification in a computing device includes: reading a circuit layout; setting parameters for components in the circuit layout; according to a preset voltage value of at least one port in the circuit layout, performing DC analysis on the circuit layout after the setting is performed to calculate a maximum possible voltage value and a minimum possible voltage value of a wire segment on the circuit layout; and inputting the maximum possible voltage value and the minimum possible voltage value into a predetermined design specification, wherein when the maximum possible voltage value or minimum possible voltage value exceeds the predetermined design specification, the wire segment is marked as abnormal.
A circuit layout verification method in a computing device, comprising:
A circuit layout verification system, comprising:
Dependencies are inferred from the claim text.