Magnetic particle imaging system and magnetic particle imaging method
AssigneeMitsubishi Electric Corporation
InventorsKazuki YAMAUCHI, Kota NOMURA
Life of this patent
Estimating the term…
Loading patent…
AssigneeMitsubishi Electric Corporation
InventorsKazuki YAMAUCHI, Kota NOMURA
Estimating the term…
The first electromagnet includes a first coil and a second coil each for generating a gradient magnetic field, the first coil and the second coil being arranged side by side at a distance from each other. The second electromagnet faces the first electromagnet with the inspection region interposed therebetween, and includes a third coil and a fourth coil each for generating a gradient magnetic field, the third coil and the fourth coil being arranged side by side at a distance from each other. The first coil and the fourth coil are connected to each other. The second coil and the third coil are connected to each other.
A magnetic particle imaging system for imaging magnetic particles present in an inspection region, the magnetic particle imaging system comprising:
A magnetic particle imaging method for imaging magnetic particles present in an inspection region, the magnetic particle imaging method comprising:
Dependencies are inferred from the claim text.