Hall sensor system biased in current

A Hall sensor system configured to receive an external bias current from an external current source, the Hall sensor system comprising:

• an internal current generator configured to split the external bias current into a plurality of internal bias currents, including a first internal bias current and a second internal bias current;
• a Hall probe configured to be biased by the first internal bias current and set at a first operating point based on the first internal bias current, wherein the Hall probe is further configured to generate a sensor signal based on a magnetic field and the first operating point;
• and
• an amplifier configured to be biased by the second internal bias current and set at a second operating point based on the second internal bias current, wherein the amplifier is configured to amplify the sensor signal into an amplified sensor signal based on the second operating point,
• wherein the Hall sensor system is integrated on a semiconductor chip.

A method of operating a Hall sensor system integrated on a semiconductor chip, the method comprising:

• receiving, by an input terminal, an external bias current from an external current source;
• splitting, by an internal current generator, the external bias current into a plurality of internal bias currents, including a first internal bias current and a second internal bias current;
• biasing a Hall sensor with the first internal bias current to set the Hall sensor at a first operating point;
• generating, by the Hall sensor, a sensor signal based on a magnetic field and the first operating point;
• biasing an amplifier with the second internal bias current to set the amplifier at a second operating point;
• and
• amplifying, by the amplifier, the sensor signal into an amplified sensor signal based on the second operating point.