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US 2025/0155494 A1Published application
Aging profile components
AssigneeMicron Technology, Inc.
InventorsLeon Zlotnik, Evgeni Bassin
Life of this patent
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Abstract
A method includes monitoring, by a temperature sensor, a temperature of a system on chip (SoC), determining temperature data of the SoC that includes an amount of time the SoC is operating at a plurality of different temperatures, normalizing the temperature data to a designated operating temperature, calculating an electromigration aging profile for the SoC based on the normalized temperature data, and determining a time-to-failure for the SoC based on the electromigration aging profile.
Claims20
A method, comprising:
- monitoring, by a temperature sensor, a temperature of a system on chip (SoC);
- determining temperature data of the SoC that includes an amount of time the SoC is operating at a plurality of different temperatures;
- normalizing the temperature data to a designated operating temperature;
- calculating an aging profile for the SoC based on the normalized temperature data;
- and
- determining a time-to-failure for the SoC based on the aging profile.
3 more elements
An apparatus, comprising:
- a system on chip (SoC);
- a voltage regulator associated with the SoC;
- a temperature sensor associated with the SoC;
- and
- a controller coupled to the SoC, the voltage regulator, and the temperature sensor, wherein the controller is configured to:
- monitor temperature data of the SoC received by the temperature sensor;
- monitor voltage data provided to the SoC by the voltage regulator;
- correlate the temperature data and the voltage data with time data;
- normalize the temperature data to a designated operating temperature of the SoC;
- calculate an electromigration aging profile for the SoC based on the normalized temperature data and voltage data;
- and
- update a designated time-to-failure for the SoC based on the calculated electromigration aging profile.
9 more elements
A system comprising:
- a system on chip (SoC);
- a timer associated with the SoC;
- a voltage regulator associated with the SoC;
- a temperature sensor associated with the SoC;
- and
- a processing device coupled to the SoC, wherein the processing device is configured to:
- monitor temperature data of the SoC received by the temperature sensor with corresponding time data received by the timer;
- monitor voltage data and current data provided to the SoC by the voltage regulator with corresponding time data received by the timer;
- correlate the temperature data and the voltage data with corresponding time data received by the timer;
- normalize the temperature data to a designated operating temperature of the SoC;
- calculate an electromigration aging profile for the SoC based on the normalized temperature data and voltage data for a period of time;
- and
- determine lifetime durability data for the SoC based on a plurality of electromigration aging profiles for the SoC over a lifetime of the SoC.
10 more elements
Dependencies are inferred from the claim text.