Antenna test assembly and method thereof

An antenna test method, comprising:

• providing a DUT, which comprises an antenna module and a circuit board, wherein the antenna module comprises a first antenna element and a second antenna element, the first antenna element comprises a first antenna pin and a second antenna pin, the second antenna element comprises a third antenna pin and a fourth antenna pin, the circuit board comprises a first line, a second line, a third line and a fourth line, and two ends of each of the first line, the second line, the third line and the fourth line are electrically connected to two metal pads, respectively, exposed on the circuit board;
• providing a first conductive element, a second conductive element, a third conductive element and a fourth conductive element;
• causing a first test pin and a first RF pin of the first conductive element to be electrically conducted to each other, causing a second test pin and a second RF pin of the second conductive element to be electrically conducted to each other, causing a third test pin and a third RF pin of the third conductive element to be electrically conducted to each other, and causing a fourth test pin and a fourth RF pin of the fourth conductive element to be electrically conducted to each other;
• electrically connecting the second test pin and the third test pin in a conductive manner;
• inputting a first RF signal into the first test pin;
• causing the first RF signal to pass through an equipment test path formed in sequence by the first test pin, the first RF pin, the first line, the first antenna pin, the second antenna pin, the second line, the second RF pin, the second test pin, the third test pin, the third RF pin, the third line, the third antenna pin, the fourth antenna pin, the fourth line, the fourth RF pin and the fourth test pin, and causing the fourth test pin to output a signal parameter;
• providing a signal standard range;
• comparing the signal parameter and the signal standard range;
• and
• determining whether there is a poor connection on the equipment test path.