Method and apparatus with frequency characteristics analysis of printed circuit board
AssigneeSamsung Electronics Co., Ltd.
InventorsDoyun KIM, Jaemin PARK, Youngmin OH, Bosun HWANG
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Abstract
An apparatus and method for analyzing a frequency characteristics of a substrate are provided, through the steps of tokenizing a trace of a substrate into a graph, generating a representation vector from the tokens of the graph, and analyzing a frequency characteristics of the substrate based on the representation vector.
Claims20
An apparatus for determining frequency characteristics of a substrate, the apparatus comprising:
- one or more processors and a memory, wherein the memory stores instructions causing the one or more processors to perform a process comprising:
- transforming a trace of the substrate to a graph and tokenizing the graph into tokens;
- generating representation vectors from the tokens;
- and
- determining the frequency characteristics based on the representation vectors.
A method for predicting frequency characteristics of a substrate performed by one or more processors, the method comprising:
- tokenizing a graph representing a trace of the substrate into a sequence of tokens;
- generating a set of representation vectors by encoding the sequence of tokens;
- and
- predicting the frequency characteristics based on the set of representation vectors.
An apparatus for determining frequency characteristics of a substrate, the apparatus comprises:
- one or more processors and a memory, wherein the memory stores instructions configured to cause the one or more processors to perform a process comprising:
- transforming a trace of the substrate into a graph;
- tokenizing the graph into a sequence of tokens using a linear layer of neural network;
- generating a set of representation vectors from the sequence of tokens using an encoder of the neural network;
- and
- using a prediction network to determine the frequency characteristics from the set of representation vectors by using a prediction network.
Dependencies are inferred from the claim text.