Test fixture assembly

A test fixture assembly, for performing a test of a DUT (Device under Test), the DUT comprising a plurality of pins exposed on a surface of the DUT, the test fixture assembly comprising:

• a circuit board comprising a plurality of test pads, which are exposed on a surface of the circuit board;
• and
• a socket unit comprising a socket base and a plurality of socket probes, which are inserted through the socket base, wherein a first end and a second end of each of the socket probes are respectively exposed on two opposite surfaces of the socket base, the first ends are configured to be electrically connected to the pins, respectively, and the second ends are electrically connected to the test pads, respectively;
• wherein each of the test pads, a corresponding one of the socket probes and a corresponding one of the pins are configured to be linearly arranged along a socket probe direction.