Method for reducing warpage occurred to substrate during packaging process
AssigneeTong Hsing Electronic Industries, Ltd.
InventorsYu-Hsiang Liu, Li-Chun Hung
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AssigneeTong Hsing Electronic Industries, Ltd.
InventorsYu-Hsiang Liu, Li-Chun Hung
Estimating the term…
A method for reducing warpage occurred to a substrate during a packaging process includes attaching a plurality of dies to an upper surface of the substrate; attaching an adhesive material having a first curing temperature to a lower surface of the substrate; applying a liquid-packaging material having a second curing temperature to surroundings of the dies; heating the substrate, the adhesive material, and the liquid-packaging material to a heating temperature not less than the first curing temperature and the second curing temperature; and cooling the substrate, the adhesive material, and the liquid-packaging material to a room temperature. When being cooled to the room temperature, the liquid-packaging material applies an upper-surface shrinkage stress to the upper surface of the substrate, the adhesive material applies a lower-surface shrinkage stress to the lower surface of the substrate, and the lower-surface shrinkage stress is substantially equal to the upper-surface shrinkage stress.
A method for reducing warpage occurred to a substrate during a packaging process, comprising:
A method for reducing warpage occurred to a substrate during a packaging process, comprising:
Dependencies are inferred from the claim text.