Semiconductor structure with thermal dissipation layer and method of manufacturing thereof
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsSam Vaziri, Xinyu Bao, Isha Datye
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsSam Vaziri, Xinyu Bao, Isha Datye
Estimating the term…
One aspect of the present disclosure pertains to a method of semiconductor device fabrication. The method includes forming a transistor on a semiconductor substrate, forming a first metal layer and an overlying second metal layer over the transistor, depositing a thermal dissipation layer over the overlying second metal layer, and annealing the thermal dissipation layer to a temperature above the threshold temperature. The depositing of the thermal dissipation layer is performed below a threshold temperature. During the annealing, the first metal layer and the overlying second metal layer are maintained below the threshold temperature.
A method of semiconductor device fabrication, comprising:
A method, comprising:
An integrated circuit (IC) structure, comprising:
Dependencies are inferred from the claim text.