US 2025/0149099 A1 · WIPE-OUT AND VERIFICATION OF A NON-VOLATILE MEMORY

Abstract

A method is described for performing a wipe-out and verification of a plurality of non-volatile memory (NVM) cells. The method includes performing an operation to set all the plurality of NVM cells to a single state. The single state may be one of a conducing or non-conducting state depending on the NVM architecture. After the operation to set the cells to the single state is complete, the verification is performed. In the verification operation, all cells of the plurality of NVM cells are set to the single state by performing a single read operation on the plurality of NVM cells. Detection of one of a conducting or non-conducting path through the plurality of NVM cells is used to verify if all cells of the NVM array had their contents wiped out. A notification is provided in response to all cells not being set to the single known state.

Claims20

Dependent claims

A method for performing a wipe-out and verification operation of a plurality of non-volatile memory (NVM) cells, the method comprising:

performing an operation to set all cells of the plurality of NVM cells to a single predetermined state;
verifying that all cells of the plurality of NVM cells are set to the single predetermined state by performing a single read operation on the plurality of NVM cells, wherein detection of one of a conducting or non-conducting path through the plurality of NVM cells is used to verify if all cells of the NVM array had their contents wiped out;
and
sending a notification of a verification failure to a verifier device if it is determined that all cells of the plurality of cells were not set to the single known state.

1 more element

Dependencies are inferred from the claim text.

Wipe-out and verification of a non-volatile memory

Life of this patent

Wipe-out and verification of a non-volatile memory

Life of this patent

Abstract

Claims20