Cross-linkers for metallic photoresist
OwnerShi-Cheng Wang, An-Ren Zi +1inventors
InventorsShi-Cheng Wang, An-Ren Zi, Ching-Yu Chang
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OwnerShi-Cheng Wang, An-Ren Zi +1inventors
InventorsShi-Cheng Wang, An-Ren Zi, Ching-Yu Chang
Estimating the term…
Methods and materials for improving the hardness of a metallic photoresist used in EUV photolithography are disclosed. A metallic cross-linker is used with the metallic photoresist. The cross-linker comprises a metal core and a plurality of ligands. The ligands may comprise at least one vinyl group or at least one acetylene group; or comprise an acrylate; or comprise a cinnamate; or be unable to participate in a crosslinking reaction. Upon radiation exposure, the ligands separate from the metal core, and the metal core can crosslink, or the ligands may crosslink. The resulting photoresist layer has increased hardness and higher EUV light sensitivity, which permits a reduced radiation dosage.
A method for preparing a patterned photoresist layer, comprising:
A photoresist solution, comprising:
A method, comprising:
Dependencies are inferred from the claim text.