Chip testing method and apparatus

A chip testing method, comprising:

• providing a plurality of chips, wherein each of the plurality of chips comprises an input pin, an output pin, and a state machine circuit;
• connecting the input pin of each of the plurality of chips to an identical input start module, wherein the identical input start module outputs a start signal to each of the plurality of chips to start the state machine circuits;
• configuring the state machine circuit of each of the plurality of chips to output a test excitation to test the plurality of chips and obtain a test result;
• and
• connecting the output pin of each of the plurality of chips to an identical testing module, wherein the identical testing module outputs the test result of each of the plurality of chips.