Probe system with integrated choke inductor

A wafer probe system, comprising:

• a probe machine configured to supply probing signals to inspect one or more devices formed on a wafer;
• and
• a probe wedge or probe card coupled to the probe machine and receiving the probing signals from the probe machine, comprising:
• one or more inductive probing needles, wherein each inductive probing needle comprises:
• a shaft comprising a first end section, a second end section, and an intermediate section between the first and second end sections, wherein the first and second end sections are made of an electrically conductive material and the intermediate section is made of an electrically non-conductive material;
• and
• a choke inductor comprising a first terminal and a second terminal, wherein the first terminal is connected to the first end section of the shaft and the second terminal is connected to the second end section of the shaft.