Optical apparatus
AssigneeRenishaw PLC
InventorsTimothy BATTEN, Ian Sean BENNELL
Life of this patent
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Abstract
A probe for use with a sample chamber, the probe including a probing element mounted on an arm, the arm insertable or inserted into the sample chamber to locate the probing element within the sample chamber, a drive mechanism for moving the arm, and a drive control system. Movement of the arm causes movement of the probing element within the sample chamber. The drive control system is for limiting movement of the arm to a specified range, the drive control system programmable to adjust the specified range.
Claims8
A probe for use with a sample chamber, the probe comprising a probing element mounted on an arm, the arm insertable or inserted into the sample chamber to locate the probing element within the sample chamber, a drive mechanism for moving the arm, wherein movement of the arm causes movement of the probing element within the sample chamber, and a drive control system for limiting movement of the arm to a specified range, the drive control system programmable to adjust the specified range.
Dependencies are inferred from the claim text.