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US 2025/0110140 A1Published application
Sample analyzer and sample analysis method
AssigneesSysmex Corporation, Eiken Chemical Co., Ltd.
InventorsMasato SHIMIZU, Hisato TAKEHARA, Mitsuyoshi SUGIE
Life of this patent
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Abstract
Disclosed is a sample analyzer including: an imaging part configured to image a test strip; a controller programmed to analyze a test strip image obtained through imaging; a display part configured to display an image analysis result of the test strip image; and an input part configured to receive an input of a predetermined instruction, wherein the controller is programmed to cause the display part to display a plurality of the test strip images selected by the input part.
Claims15
A sample analyzer comprising:
- an imaging part configured to image a test strip;
- a controller programmed to analyze a test strip image obtained through imaging;
- a display part configured to display an image analysis result of the test strip image;
- and
- an input part configured to receive an input of a predetermined instruction, wherein
- the controller is programmed to cause the display part to display a plurality of the test strip images selected by the input part.
3 more elements
A sample analysis method comprising
- imaging a test strip, analyzing a test strip image having been obtained, and storing the test strip image;
- selecting a plurality of specific images out of a plurality of the test strip images having been stored;
- and
- displaying the plurality of specific images on a display part.
1 more element
Dependencies are inferred from the claim text.