Cleanroom certification and hepa filter scanning

A system for in-situ testing of a device under test, the system comprising:

• a mobile base;
• a telescoping pole extending upwards from the mobile base, the telescoping pole having a first end mechanically coupled to the mobile base and a second end distal from the mobile base;
• an articulated arm extending outward from the second end of the telescoping pole, the articulated arm having a first end mechanically coupled to the second end of the telescoping pole, a second end distal from the telescoping pole, and at least a first joint between the first end and the second end, the first joint dividing the articulated arm into at least a first portion and a second portion and allowing movement of the first portion at an angle with respect to the second portion;
• a first isokinetic probe mechanically coupled to the second end of the articulated arm;
• a first instrument mounted to the mobile base and configured to receive first samples from the first isokinetic probe and generate first data representing first particulate measurements;
• a second isokinetic probe mechanically coupled to the second end of the articulated arm;
• a second instrument mounted to the mobile base and configured to receive second samples from the second isokinetic probe and generate second data representing second particulate measurements;
• a Y-tube having a first end for obtaining third samples upstream with respect to airflow through the device under test and a second end having a first opening coupled to the first instrument and a second opening coupled to the second instrument;
• one or more processors;
• and
• one or more memory components containing instructions that, when executed by the one or more processors, cause the one or more processors to:
• receive, from the first instrument, third data representing a third particulate measurement of the third samples,
• receive, from the second instrument, fourth data representing a fourth particulate measurement of the third samples,
• actuate the at least first joint to scan the first isokinetic probe and the second isokinetic probe along a predetermined path with respect to the device under test, and
• process the first data, the second data, the third data, and the fourth data to generate a first measurement profile of the device under test.