Manufacturing method of semiconductor structure
AssigneeUnited Microelectronics Corp.
InventorZhenhai Zhang
Life of this patent
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AssigneeUnited Microelectronics Corp.
InventorZhenhai Zhang
Estimating the term…
A manufacturing method of the semiconductor structure including the following is provided. Gate structures are formed on a substrate. Each gate structure includes a gate, a first spacer, and a second spacer. The gate is disposed on the substrate. The first spacer is disposed on a sidewall of the gate. The second spacer is disposed on the first spacer. In a region between two adjacent gate structures, the first spacers are separated from each other, and the second spacers are separated from each other. A protective layer is formed between the two adjacent gate structures. The protective layer covers lower portions of the second spacers and exposes upper portions of the second spacers. A part of the upper portions of the second spacers is removed using the protective layer as a mask to enlarge a distance between the upper portions of the second spacers. The protective layer is removed.
A manufacturing method of a semiconductor structure, comprising:
Dependencies are inferred from the claim text.